EM-FI Transient Coils (High precision)

The high precision EM-FI probe tips can provide a local precision glitch using powerful electric magnetic pulses. The high precision tips feature small coils that result in a local glitch that because of the special production technique that we use, with multiple windings, still deliver enough power to be successful with fault injection attempts. Because of the smaller diameter coils, the penetration depth of the high precision tips is lower compared to the bigger diameter probe tips. Because of this preparing (decapping) the chip might be necessary.

 

      • Reduce the area of impact for the injected fault, making it easier to analyze what exact part of the chip is vulnerable.
      • Increase your fault injection success rate.
      • Because of the high power the tips are able to generate, decapping the chip is not always needed.